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Products > CMM scanners > XC50 Cross Scanner

XC50 Cross Scanner
A paradigm for feature measurements

The Cross Scanner is a revolutionary new 3D laser scanner for feature measurement. The Cross Scanner is a patented high-speed, multi-stripe laser sensor that enables more efficient 3D scanning of features such as holes, slots and gap & step that are typically inspected in automotive applications.

Scanning an engine block Scanning a sheet metal part XC50 Cross Scanner

Key features of 3D laser scanner

  • Patented multi-stripe, multi-angle laser scanner viewing 3 laser stripes from 3 angles
  • True 3D measurement opposed to classical 2 1/2D optical measurement
  • Optimal point distribution in all directions
  • Fully compatible with Renishaw PH10 and ACR-3 exchange rack
  • ­Automated qualification of the PH10 orientations
  • Easy macro based path programming
  • Available for integration in native CMM software applications

Key benefits of 3D laser scanner

  • No re-orientation during scanning:
    • No need for an extra C-axis
    • Faster digitizing
  • True 3D digitizing resulting in high accuracy feature measurements

Applications

  • Feature inspection
  • Gap and flush
  • Sheet metal inspection: slot, holes, etc
  • Molded plastics: e.g. cell phones

Experience

Metris is the market leader in CMM based laser scanning and offers more than 10 years of experience in developing and producing laser scanners. Our focus lies on accuracy, productivity and CMM integration. We offer the widest range of integration options and solutions on the market and can mount our scanners onto virtually any type of CMM including such brand names as Mitutoyo, Brown and Sharpe, DEA, Zeiss, Wenzel, Mora and Dukin. We also support integration on controllers by Renishaw and Metrolog.

Cross Scanner specifications

Weight 510g
Dimensions 148x86x136mm
Scan Speed 3x6400 real1 pts/s
Width of view 3x50mm
Depth of view 3x50mm
Accuracy2 15µm (1σ sphere fit)
Stand off distance 70mm
Laser Class 3R (visible)
1 Metris points-per-second and points-per-line specifications state real scan points only. No interpolation techniques are used to oversample the point clouds!
2 Depending on CMM & according to Metris acceptance procedure
All specifications are subject to change without notice.

Case studies


XC50 Cross Scanner


Product brochures

Metris CMM scanning solutions

XC50 Cross Scanner


Latest news

24/04/2008
Metris iSpace creates large-scale metrology workspace on the spot

17/04/2008
Metris releases RCA for robotized laser inspection

19/03/2008
Metris realizes 50% sales growth and nearly doubles net profit


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